[Download] "Thickness Measurement of Semiconductor Films using the NanoCalc Reflectometer" by Ocean Optics * eBook PDF Kindle ePub Free
eBook details
- Title: Thickness Measurement of Semiconductor Films using the NanoCalc Reflectometer
- Author : Ocean Optics
- Release Date : January 09, 2013
- Genre: Science & Nature,Books,
- Pages : * pages
- Size : 61116 KB
Description
Reflectometry is a non-destructive, non-contact way to measure the thickness of films using light. This application note describes the processes and equipment used in measuring the thickness of thin films in the production of semiconductors.